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Archives of Clinical Neuropsychology Advance Access published online on July 18, 2009
Archives of Clinical Neuropsychology, doi:10.1093/arclin/acp034
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© The Author 2009. Published by Oxford University Press. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org.

Digit Span Age Scaled Score in Middle-Aged Military Veterans: Is It More Closely Associated with TOMM Failure than Reliable Digit Span?

Kriscinda A. Whitneya,b,*, Jeremy J. Davisc, Polly H. Shepardb,d, David M. Bertramc and Kenneth M. Adamse

a Richard L. Roudebush Veterans Affairs Medical Center, Indianapolis, IN, USA
b Indiana University School of Medicine, Indianapolis, IN, USA
c University of Indianapolis, Indianapolis, IN, USA
d Professional Psychological Services, Indianapolis, IN, USA
e VA Ann Arbor Healthcare System, University of Michigan Health System, Ann Arbor, MI, USA

* Corresponding author at: Richard L. Roudebush VAMC (116P), 1481 W. 10th Street, Indianapolis, IN 46202, USA. Tel: +1-317-988-2006; fax: +1-317-988-3578. E-mail address: kamarks{at}iupui.edu (K. A. Whitney).


  Abstract

The relative usefulness of two digit span (DS) variables in detecting negative response bias, as defined by below cut-off performance on the Test of Memory Malingering (TOMM), was examined among primarily middle-aged military veteran outpatients who were judged clinically to be at increased risk for displaying negative response bias on cognitive testing. Digit span variables included DS Age Scaled Score (DS Age SS) and Reliable DS. Findings from this retrospective data analysis (N = 46) suggest that DS Age SS is preferable for use over Reliable DS in predicting TOMM failure. Results of the current study suggest that, particularly if the Wechsler scales are an existing part of the neuropsychological assessment, examination of DS Age SS is an efficient means of detecting negative response bias.

Keywords Test validity; Neuropsychology; Malingering; Military veterans; Memory

Accepted: June 17, 2009


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